Infrared (IR) spectroscopy is one of the most accepted analytical measurement methods for the characterization of materials in government, academic, and industrial R&D laboratories. The spatial ...

The new patented Tapping AFM-IR™ mode from Anasys Instruments is considered the most advanced development in nanoscale IR technology and it provides the highest spatial resolution for chemical imaging ...

Since it's inception, PeakForce Tapping has been cited by over 4000 publications; more than 1 paper per day for the last 10 years. This article will look at some of the increased capabilities this ...

Click on the Tune Tab in the Master Panel. Set the tune high and low frequency according to the cantilevers being used and the application. For general tapping mode cantilevers: ...

In this study, we employed microscopy, patented by Keysight Technologies, Inc., MAC Mode atomic force, which uses a magnetically-driven oscillating probe with an oscillation amplitude significantly ...

In the field of nanotechnology, where properties and functionality of nanostructures critically depend on their dimensions, measuring size differences of the order of nanometers or even angstroms is ...

The JPK NanoWizard ® V from Bruker Nano Surfaces integrates high spatio-temporal resolution with a large scan area, flexible experiment design and outstanding integration with the latest optical ...

Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Nanoscope II operates in contact mode and is primarily used for high-resolution imaging and surface force measurements in ...

Bruker Nano Surfaces Divison is a leading provider of high-performance scientific instruments and solutions for molecular and materials research, as well as for industrial and applied analysis. We ...

There are several different types of scanning probe microscopes, the most prominent of which are atomic force microscopy (AFM) and scanning tunneling microscopy (STM). There are also many other types, ...